ASTM D2685-2011 用气体色层分离法对六氟化硫中空气和四氟化碳含量的标准试验方法

作者:标准资料网 时间:2024-05-12 23:57:30   浏览:8811   来源:标准资料网
下载地址: 点击此处下载
【英文标准名称】:StandardTestMethodforAirandCarbonTetrafluorideinSulfurHexafluoridebyGasChromatography
【原文标准名称】:用气体色层分离法对六氟化硫中空气和四氟化碳含量的标准试验方法
【标准号】:ASTMD2685-2011
【标准状态】:现行
【国别】:
【发布日期】:2011
【实施或试行日期】:
【发布单位】:美国材料与试验协会(US-ASTM)
【起草单位】:D27.03
【标准类型】:(TestMethod)
【标准水平】:()
【中文主题词】:空气;四氟化碳;六氟化硫;大气分析;四氟化碳含量
【英文主题词】:air;carbontetrafluoride;sulfurhexafluoride;Airanalysis;Carbontetrafluoridecontent
【摘要】:Airandcarbontetrafluoride(CF4)aretwocontaminantsofinterestinsulfurhexafluoride(SF6).BothofthesecontaminantsadverselyaffecttheperformanceofSF6whenusedasanelectricalinsulatinggas.SpecificationformaximumlevelsofthesecontaminantsaregiveninSpecificationD2472.GaschromatographyisusedtoseparatethesecontaminantsfromasampleofSF6andtodeterminetheirconcentration.1.1Thistestmethodcoversthedeterminationofair(Note1)andcarbontetrafluorideasimpuritiesinsulfurhexafluoride.Note18212;Nitrogen,oxygen,oranyoftheirmixturesisconsideredtobeair.Commercialgradeairornitrogenisusedforstandardization.1.2ThevaluesstatedinSIunitsaretoberegardedasstandard.Nootherunitsofmeasurementareincludedinthisstandard.1.3Thisstandarddoesnotpurporttoaddressallofthesafetyconcerns,ifany,associatedwithitsuse.Itistheresponsibilityoftheuserofthisstandardtoestablishappropriatesafetyandhealthpracticesanddeterminetheapplicabilityofregulatorylimitationspriortouse.
【中国标准分类号】:
【国际标准分类号】:71_060_50
【页数】:3P.;A4
【正文语种】:


下载地址: 点击此处下载
MIL-PRF-38535H, PERFORMANCE SPECIFICATION: INTEGRATED CIRCUITS (MICROCIRCUITS) MANUFACTURING, GENERAL SPECIFICATION FOR (16 MAR 2007)., This specification establishes the general performance requirements for integrated circuits or microcircuits and the quality and reliability assurance requirements, which are to be met for their acquisition. The intent of this specification is to allow the device manufacturer the flexibility to implement best commercial practices to the maximum extent possible while still providing product that meets military performance needs. Detail requirements, specific characteristics of microcircuits, and other provisions which are sensitive to the particular use intended will be specified in the device specification. Quality assurance requirements outlined herein are for all microcircuits built on a manufacturing line which is controlled through a manufacturer's quality management (QM) program and has been certified and qualified by the Qualifying Activity (QA) in accordance with requirements herein. Several levels of product assurance including RHA are provided for in this specification. The certification and qualification sections found herein outline the requirements to be met by a manufacturer to be listed on a Qualified Manufacturer Listing (QML).