Product Code:SAE ARP794
Title:Airstream Deviation Instrument (ADI)
Issuing Committee:A-4 Aircraft Instruments Committee
Scope:This Aerospace Recommended Practice recommends the industry standards for an Airstream Deviation Instrument primarily for use with turbine-powered, subsonic transport aircraft, the operation of which may subject the instruments to the environmental conditions specified in Paragraph 3.4. This recommended practice covers an instrument which measures and displays angle of deviation of the airstream dependent on mounting location on the aircraft.【英文标准名称】:Semiconductordevices-Mechanicalandclimatictestmethods-Part26:Electrostaticdischarge(ESD)sensitivitytesting-Humanbodymodel(HBM)
【原文标准名称】:半导体器件.机械和气候试验方法.第26部分:静电放电敏感性(ESD)试验.人体模型(HBM)
【标准号】:IEC60749-26-2006
【标准状态】:现行
【国别】:国际
【发布日期】:2006-07
【实施或试行日期】:
【发布单位】:国际电工委员会(IX-IEC)
【起草单位】:IEC/TC47
【标准类型】:()
【标准水平】:()
【中文主题词】:大气压;温度变化;分类;分类系统;气候;气候试验;组件;定义;尺寸;放电;电气元件;电气工程;电学测量;电子工程;电子设备及元件;静电的;静电放电;静电学;环境;环境试验;故障;易燃性;热学;人体;脉冲负载能力;集成电路;测量设备;机械试验;模型;潮气;耐力;半导体器件;半导体;模拟;温度;试验;试验装置;外观检查(试验)
【英文主题词】:Atmosphericpressure;Changesoftemperature;Checkingequipment;Classification;Classificationsystems;Climate;Climatictests;Components;Definitions;Dimensions;Discharge;Electricalcomponents;Electricalengineering;Electricalmeasurement;Electronicengineering;Electronicequipmentandcomponents;Electrostatic;Electrostaticdischarges;Electrostatics;Environment;Environmentaltesting;Environmentaltests;Failure;Flammability;Heat;Humanbody;Impulseloadability;Integratedcircuits;Measuringequipment;Mechanicaltesting;Models;Moisture;Resistance;Semiconductordevices;Semiconductors;Simulation;Temperature;Testing;Testingdevices;Visualinspection(testing)
【摘要】:ThispartofIEC60749establishesastandardprocedurefortestingandclassifyingsemiconductordevicesaccordingtotheirsusceptibilitytodamageordegradationbyexposuretoadefinedhumanbodymodel(HBM)electrostaticdischarge(ESD).Theobjectiveistoprovidereliable,repeatableHBMESDtestresultssothataccurateclassificationscanbeperformed.Thistestmethodisapplicabletoallsemiconductordevicesandisclassifiedasdestructive.ESDtestingofsemiconductordevicesisselectedfromthistestmethod,themachinemodel(MM)testmethod(seeIEC60749-27)orotherESDtestmethodsintheIEC60749series.TheHBMandMMtestmethodsproducesimilarbutnotidenticalresults;unlessotherwisespecified,thistestmethodistheoneselected.NOTECertainclausesinthistestmethodareinaccordancewithIEC61340-3-1.
【中国标准分类号】:L40
【国际标准分类号】:31_080_01
【页数】:27P.;A4
【正文语种】:英语